Biswas, R and Dandu, M and Jha, KK and Menon, S and Jyothsna, KM and Majumdar, K and Raghunathan, V (2020) Layer-dependent third-harmonic generation in multi-layer SnSe2. In: 2D Photonic Materials and Devices III 2020, 5-6 Feb 2020, San Francisco.
Full text not available from this repository.Abstract
We report spatially resolved measurement of third-harmonic generation (THG) emission from a Tin diselenide (SnSe2) multi-layer flake at a fundamental excitation wavelength of 1550 nm using a nonlinear optical microscopy system and study its thickness dependence. We also estimate the magnitude of the real part of the electronic nonlinearity susceptibility (�(3) coefficient) by analyzing the thickness-dependence and found to be approximately 1.6�10-19 m2/V2, which is around 1500 times higher than that of the glass when measured with the same settings. We find excellent agreement between the measured THG thickness dependence and the analytical model considering absorption of harmonic emission in SnSe2 medium, phase mismatch and the multipath interference due to the underlying oxide/Si substrate. We also measure the second harmonic generation from same flake and find this to be maximum for thickness in the range of 10-12nm. © 2020 SPIE.
| Item Type: | Conference Paper |
|---|---|
| Publication: | Proceedings of SPIE - The International Society for Optical Engineering |
| Publisher: | SPIE |
| Additional Information: | The copyright for this article belongs to SPIE |
| Keywords: | Harmonic analysis; Nonlinear optics; Photonic devices; Selenium compounds; Tin compounds, Diselenide; Excitation wavelength; Harmonic emissions; Multi-path interference; Nonlinear optical microscopy; Phase mismatch; Spatially resolved; Thickness dependence, Harmonic generation |
| Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
| Date Deposited: | 03 Nov 2021 09:34 |
| Last Modified: | 03 Nov 2021 09:34 |
| URI: | http://eprints.iisc.ac.in/id/eprint/65237 |
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