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Tailoring of uniaxial magnetic anisotropy in Permalloy thin films using nanorippled Si substrates

Koyiloth Vayalil, S and Koorikkat, A and Gopi, AK and Roth, SV and Anil Kumar, PS (2020) Tailoring of uniaxial magnetic anisotropy in Permalloy thin films using nanorippled Si substrates. In: Journal of Physics Condensed Matter, 32 (18).

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Official URL: https://dx.doi.org/10.1088/1361-648X/ab6d0d


In this work the investigation of in-plane uniaxial magnetic anisotropy induced by the morphology due to ion beam erosion of Si(1 0 0) has been done. Ion beam erosion at an oblique angle of incidence generates a well-ordered nanoripple structure on the Si surface and ripple propagates in a direction normal to ion beam erosion. Permalloy thin films grown on such periodic nanopatterns show a strong uniaxial magnetic anisotropy with easy axis of magnetization in a direction normal to the ripple wave vector. The strength of uniaxial magnetic anisotropy is found to be high for the low value of ripple wavelength; it is decreasing with increasing value of ripple wavelength. Similarly, the strength of uniaxial magnetic anisotropy decreases with increasing Permalloy film thickness. Grazing incidence small angle x-ray scattering data reveals an anisotropic growth of Permalloy thin films with preferential orientation of grains in the direction normal to the ripple wave vector. Permalloy thin film growth is highly conformal with the film surface replicating the substrate ripple morphology up to a film thickness of 50 nm has been observed. Correlation between observed uniaxial magnetic anisotropy to surface modification has been addressed.

Item Type: Journal Article
Publication: Journal of Physics Condensed Matter
Additional Information: The copyright of this article belongs to IOP PUBLISHING LTD
Keywords: Erosion; Film growth; Film thickness; Ion beams; Ions; Iron alloys; Magnetism; Morphology; Nickel alloys; Permalloy; Silicon; Sputtering; Substrates; Thin films; X ray scattering, Anisotropic growth; Easy axis of magnetization; Grazing incidence small-angle X-ray scattering; Ion beam erosion; Permalloy thin films; Preferential orientation; Ripple wavelength; Uniaxial magnetic anisotropy, Magnetic anisotropy
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 19 Jun 2020 07:12
Last Modified: 19 Jun 2020 07:12
URI: http://eprints.iisc.ac.in/id/eprint/65044

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