Irzhak, A and Koledov, V and Zhuravleva, T and Kumar, P (2019) Melting of metall nano particles for nanoassembling. In: 9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019, 4-8, August 2019, Zhenjiang; China, pp. 78-81.
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Abstract
The size effect on the melting temperature of metal nanowires and nanoparticles was studied under action of resistive heating and laser irradiation in the vacuum chamber of scanning ion microscope and TEM. The 100 nm thick In nanowires were produced by FIB milling, the 20 - 200 nm In and Au nanoparticles were produced by laser ablation. The partial melting of indium particles at t � 55 °C was demonstrated, which is at least 100 degrees less than melting temperature of a bulk In sample. As a result of heating by the laser, a partial melting of the submicron In nanowire was also observed below bulky sample melting point. The results of the study of size effect on melting of metal nanosamples can be applied to development of the new technology of low-temperature nanosoldering of nanoelectronic parts, fibers, lamellae etc.
Item Type: | Conference Paper |
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Publication: | 2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings |
Publisher: | Institute of Electrical and Electronics Engineers Inc. |
Additional Information: | cited By 0; Conference of 9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 ; Conference Date: 4 August 2019 Through 8 August 2019; Conference Code:156625 |
Keywords: | Gold nanoparticles; Laser ablation; Manufacture; Melting point; Metals; Nanowires; Size determination, Indium particles; Low temperatures; Microwire; Nanosoldering; Resistive heating; Scanning ion microscopes; Size effects; Vacuum chambers, Metal nanoparticles |
Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
Date Deposited: | 13 Aug 2020 09:59 |
Last Modified: | 13 Aug 2020 09:59 |
URI: | http://eprints.iisc.ac.in/id/eprint/64616 |
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