Electric current driven formation of micro-and nano-sized beads in thin Cr films

Sharma, M and Kumar, S and Pratap, R and Irzhak, A and Kumar, P and Von Gratowski, S and Koledov, V and Lega, P and Shavrov, V (2020) Electric current driven formation of micro-and nano-sized beads in thin Cr films. In: 9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019, 4-8 August 2019, Zhenjiang; China, pp. 86-89.

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Abstract

Nano films of chromium with thicknesses from 20 to 200 nm were deposited on silicon substrates and were treated by electric current induced by AFM tip in ambient atmosphere. The melting on the nanoscale, electric current induced migration of the material and chemical reaction of oxidization of chromium were revealed in melting craters around the point of application of the current by optical and electronic scanning microscopy, AFM, and Raman spectroscopy. The flow of the material induced by electric current is accompanied by formation and motion of the matrix of the spherical nanoparticles (beads) in the crater of melt on its periphery. The reaction of chromium oxidation and surface tension of the melted material on the silicon substrate are expected to be responsible for the matrix of nano beads formation under comparatively small currents. Raman spectroscopy confirms that in the vicinity of the periphery of the melted craters around AFM tip application, the beads of oxide phase Cr2O5 are present.

Item Type:	Conference Paper
Publication:	2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	Copyright of this article belongs to IEEE
Keywords:	Chromium; Chromium compounds; Electric currents; Electromigration; Melting; Nanoprobes; Raman spectroscopy; Scanning electron microscopy; Surface tension; Thin films, AFM tip; Ambient atmosphere; Chromium oxidation; Electronic scanning microscopy; Nano-beads formation; Point of application; Silicon substrates; Spherical nanoparticles, Substrates
Department/Centre:	Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited:	28 Feb 2020 07:31
Last Modified:	28 Feb 2020 07:31
URI:	http://eprints.iisc.ac.in/id/eprint/64615

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