Nanostructured Zn-Substituted Nickel Ferrite Thin Films: CMOS-Compatible Deposition and Excellent Soft Magnetic Properties

Kahmei, RDR and Sai, R and Arackal, S and Shivashankar, SA and Bhat, N (2019) Nanostructured Zn-Substituted Nickel Ferrite Thin Films: CMOS-Compatible Deposition and Excellent Soft Magnetic Properties. In: IEEE Magnetics Letters, 10 .

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Abstract

Nanostructured \textNi-x\textZn-1-xFe2O4 (x = 1, 0.5) films, about 1.5 μm thick on Si (100) substrates, were deposited using a low-Temperature (<150 C) microwave-Assisted solvothermal (MAS) technique that is compatible with back-end-of-The-line Si-CMOS processing. A nanocrystalline single-phase spinel structure with crystallite sizes of �4 nm for the nickel ferrite film (NF) and �6 nm for the zinc-substituted NF (ZNF) was obtained. The films demonstrate excellent surface smoothness and strong adherence to the substrate. Deconvolution of the A-1g vibration mode in Raman spectra of both films reveals a ''far-from-equilibrium'' crystallographic inversion induced by the MAS process. Its effect on the magnetic characteristics of the films is analyzed here. Both films exhibit in-plane (xy plane) isotropy with very low room-Temperature coercivities, 25 Oe for NF and 35 Oe for ZNF, which is essential for high-frequency, soft magnetic applications. The presence of interparticular dipolar interaction in both films is confirmed from temperature-dependent magnetization measurements made under different dc bias fields. The CMOS-compatible ferrite processing and superparamagnetic Ni-ferrite and NiZn-ferrite thin films presented here can meet upcoming technological needs in on-chip integrated passive devices.

Item Type:	Journal Article
Publication:	IEEE Magnetics Letters
Publisher:	Institute of Electrical and Electronics Engineers Inc.
Additional Information:	Copyright of this article belongs to Institute of Electrical and Electronics Engineers Inc.
Keywords:	CMOS integrated circuits; Crystallite size; Deposition; Ferrite; Magnetism; Nanocrystals; Nickel; Soft magnetic materials; Substrates; Temperature, Integrated passive device; Microwave assisted; Ni ferrites; Ni-Zn ferrites; Single-phase spinel structure; Soft magnetic films; Soft magnetic properties; Temperature dependent magnetization measurement, Thin films
Department/Centre:	Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited:	28 Jan 2020 07:32
Last Modified:	28 Jan 2020 07:32
URI:	http://eprints.iisc.ac.in/id/eprint/64461

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