Km, J and Kim, H and Raghunathan, V (2019) Sub-diffraction resolution of periodic grating structures in a focus engineered sum frequency generation microscope. In: International Conference on Optical MEMS and Nanophotonics, OMN 2019, 28 July 2019 -1 August 2019, Daejeon, Korea (South), Korea (South), pp. 74-75.
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Abstract
Use of Toraldo-Type pupil phase masks in a nonlinear sum frequency generation microscope for subdiffraction resolution improvement is simulated. It is found that optimally chosen 0-w phase mask of diameter 64 of the full aperture results in reduction in the nonlinear focal field by 60 of the no phase mask case with 75 of energy concentrated in the central lobe. When imaging periodic grating structures, resonant enhancement and reversal of contrast are observed for grating pitch comparable to the diameter of the side lobes. The resonant contrast enhancement can potentially be used for selectively amplifying certain spatial frequencies in the sample.
Item Type: | Conference Paper |
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Publication: | International Conference on Optical MEMS and Nanophotonics |
Publisher: | IEEE Computer Society |
Additional Information: | Copyright of this article belongs to IEEE |
Keywords: | Interferometry; MOEMS; Nanophotonics, Contrast Enhancement; Full width half maximum; Periodic gratings; Resolution improvement; Resonant enhancements; Spatial frequency; Sum frequency generation; Super-resolution microscopy, Diffraction gratings |
Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 10 Feb 2020 09:02 |
Last Modified: | 10 Feb 2020 09:02 |
URI: | http://eprints.iisc.ac.in/id/eprint/64458 |
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