ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Axial Super-Resolution in Ultrasound Imaging

Shastri, SK and Rudresh, S and Anand, R and Nagesh, S and Mazumder, D and Thittai, AK and Sekhar Seelamantula, C (2020) Axial Super-Resolution in Ultrasound Imaging. In: IEEE International Ultrasonics Symposium, IUS, 6-9 October, 2019, Glasgow; United Kingdom, pp. 639-642.

[img] PDF
Restricted to Registered users only

Download (1MB) | Request a copy
Official URL: https://dx.doi.org10.1109/ULTSYM.2019.8926263


A fundamental challenge in non-destructive evaluation using ultrasound is to accurately estimate the thicknesses of different layers or cracks present in the object being probed. This inherently corresponds to localizing the point-sources of the reflections from the received signal. Conventional signal processing techniques cannot resolve reflectors whose spacing is below the axial resolution limit, which is of the order of the wavelength of the probing pulse. The objective of this paper is to demonstrate axial super-resolution capability using both simulated and experimental ultrasound data. We show that the ultrasound reflections could be modelled effectively as FRI signals, which can be sampled at sub-Nyquist rates. The FRI sampling method brings the reconstruction problem within a parametric estimation framework, for which efficient high-resolution spectral estimation techniques are available. We experimentally demonstrate that the proposed technique is able to resolve the thicknesses of layers of custom designed Agarose phantoms that are up to 2.25 times below the conventional resolution limit.

Item Type: Conference Paper
Publication: IEEE International Ultrasonics Symposium, IUS
Publisher: IEEE Computer Society
Additional Information: cited By 0; Conference of 2019 IEEE International Ultrasonics Symposium, IUS 2019 ; Conference Date: 6 October 2019 Through 9 October 2019; Conference Code:155971
Keywords: Nondestructive examination; Optical resolving power; Optical variables measurement; Spectrum analysis; Ultrasonic imaging, Axial resolutions; Finite rate of innovations; Non destructive evaluation; Sub-Nyquist sampling; Super resolution; Ultrasound imaging, Ultrasonic testing
Department/Centre: Division of Electrical Sciences > Electrical Engineering
Date Deposited: 13 Aug 2020 09:33
Last Modified: 13 Aug 2020 09:33
URI: http://eprints.iisc.ac.in/id/eprint/64445

Actions (login required)

View Item View Item