Sub-diffraction resolution of periodic grating structures in a focus engineered sum frequency generation microscope

Km, J and Kim, H and Raghunathan, V (2019) Sub-diffraction resolution of periodic grating structures in a focus engineered sum frequency generation microscope. In: 2019 International Conference on Optical MEMS and Nanophotonics (OMN), 28 July-1 Aug. 2019, Daejeon, Korea (South), pp. 74-75.

PDF int_con_opt_mem_nan_74-75_2019.pdf - Published Version Restricted to Registered users only Download (1MB) | Request a copy

Abstract

Use of Toraldo-Type pupil phase masks in a nonlinear sum frequency generation microscope for subdiffraction resolution improvement is simulated. It is found that optimally chosen 0-w phase mask of diameter 64 of the full aperture results in reduction in the nonlinear focal field by 60 of the no phase mask case with 75 of energy concentrated in the central lobe. When imaging periodic grating structures, resonant enhancement and reversal of contrast are observed for grating pitch comparable to the diameter of the side lobes. The resonant contrast enhancement can potentially be used for selectively amplifying certain spatial frequencies in the sample.

Item Type:	Conference Paper
Publication:	International Conference on Optical MEMS and Nanophotonics
Publisher:	IEEE Computer Society
Additional Information:	Copyright of this article belongs to IEEE
Keywords:	Interferometry; MOEMS; Nanophotonics, Contrast Enhancement; Full width half maximum; Periodic gratings; Resolution improvement; Resonant enhancements; Spatial frequency; Sum frequency generation; Super-resolution microscopy, Diffraction gratings
Department/Centre:	Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited:	03 Feb 2020 11:27
Last Modified:	03 Feb 2020 11:27
URI:	http://eprints.iisc.ac.in/id/eprint/64380

Actions (login required)

View Item