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Crystallization kinetics of Si20Te80-xBix (0 <= x <= 3) chalcogenide glasses

Fernandes, Brian Jeevan and Ramesh, K and Udayashankar, N K (2019) Crystallization kinetics of Si20Te80-xBix (0 <= x <= 3) chalcogenide glasses. In: MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS, 246 . pp. 34-41.

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Official URL: https://dx.doi.org/10.1016/j.mseb.2019.05.030


In this report, we investigate the crystallization kinetics of Si20Te80-xBi(0 <= x <= 3) chalcogenide glassy systems using differential scanning calorimetry (DSC) technique. Systematic studies are carried out in order to understand the variation of thermal parameters such as glass transition temperature (T-g), onset crystallization temperature (T-c) and peak crystallization temperature (T-p) as a function of composition. Activation energy for glass transition (E-g) and crystallization (E-c) has been calculated based on the relevant statistical methods. Furthermore, thermal parameters such as change in specific heat (Delta C-p), fragility index (F), thermal stability (Delta T) & (S), enthalpy (Delta H-c), entropy (Delta S) are deduced to interpret distinct material behaviour as a function of composition. Structural evaluation like thermal devitrification studies elucidate the restricted glass formability of the studied glass system. Conclusively, a relationship has been established between the obtained thermal parameters and electrical switching characteristics.

Item Type: Journal Article
Publisher: ELSEVIER
Additional Information: copyright for this article belongs to ELSEVIER
Keywords: Differential scanning calorimetry; Activation energy; Thermal stability; Crystallization
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 17 Sep 2019 07:34
Last Modified: 17 Sep 2019 07:34
URI: http://eprints.iisc.ac.in/id/eprint/63569

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