Enhanced structural, optical, thermal, mechanical and electrical properties by a noval approach (nanoparticle doping) on ferroelectric triglycine sulphate single crystal

Mahendra, K and Kumar, HKT and Udayashankar, NK (2019) Enhanced structural, optical, thermal, mechanical and electrical properties by a noval approach (nanoparticle doping) on ferroelectric triglycine sulphate single crystal. In: Applied Physics A: Materials Science and Processing, 125 (4).

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Abstract

The pristine and AgNP-doped TGS crystals are studied using powder X-ray diffraction, density measurements, solubility studies, UV–Vis analysis, photoluminescence spectroscopic analysis, thermal gravimetric analysis, differential thermal analysis, differential scanning calorimetry, Vicker’s hardness measurements, I–V and impedance measurements. From the XRD studies, TGS crystal formation is confirmed and by further analyzing X-ray diffraction data it is noticed that the incorporation of nanoparticles induce stress in the lattice of TGS crystal, which, in turn, lead to shift in peak positions. Crystal solubility and density values are increased after doping process. From the emission spectrum it is evident that emission intensity increases as the doping concentration increased. The melting point and mechanical hardness of the crystals also showed improvement after AgNP doping. Band gap calculated by Tauc’s relation is found to decrease with increase in doping concentration. Further, electrical studies demonstrated that crystal conductivity is improved as the doping concentration increases

Item Type:	Journal Article
Publication:	Applied Physics A: Materials Science and Processing
Publisher:	Springer Verlag
Additional Information:	The copyright for this article belongs to the Springer Verlag.
Keywords:	Differential scanning calorimetry; Differential thermal analysis; Emission spectroscopy; Energy gap; Gravimetric analysis; Hardness; Nanoparticles; Single crystals; Solubility; Spectroscopic analysis; Sulfur compounds; Thermogravimetric analysis; X ray diffraction, Doping concentration; Hardness measurement; Impedance measurement; Mechanical and electrical properties; Mechanical hardness; Powder X ray diffraction; Thermal gravimetric analysis; X-ray diffraction data, Doping (additives)
Department/Centre:	Division of Mechanical Sciences > Chemical Engineering
Date Deposited:	11 Apr 2019 11:15
Last Modified:	25 Aug 2022 08:10
URI:	https://eprints.iisc.ac.in/id/eprint/62064

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