An Integrated Magnetic Actuation System for High-Speed Atomic Force Microscopy

Sriramshankar, R and Jayanth, GR (2018) An Integrated Magnetic Actuation System for High-Speed Atomic Force Microscopy. In: IEEE-ASME TRANSACTIONS ON MECHATRONICS, 23 (5). pp. 2285-2294.

PDF Ieee_Tra_Mec_23-5_2285_2018.pdf - Published Version Restricted to Registered users only Download (4MB) | Request a copy

Abstract

High-speed atomic force microscopy enables in situ studies of dynamic phenomena at the nanometer-scale. This paper presents the design, fabrication, and evaluation of an integrated magnetic actuation system for high-speed atomic force microscopy. The proposed system consists of a microcantilever probe with an attached permanent magnet particle and a microactuator for generation of magnetic field. Novel geometries are proposed for the probe, the magnetic particle, and the actuator that together result in a high bandwidth and adequate actuation gain. A lumped parameter model is developed for the probe's dynamics and employed to optimize its design. Subsequently the integrated actuation system has been fabricated and evaluated. The actuator has been shown to generate actuation fields as high as 216 G with associated temperature rise of less than 8 degrees C. The probe has been evaluated to have an Eigen-frequency of 104 kHz with an actuation gain of 1 nm/G in air. Characterization of the probe in water reveals the reduction in Eigen-frequency to be merely 23%, which is nearly 3-fold less than that of a conventional probe. Finally, the developed actuation system has been employed to perform high-speed dynamic mode imaging of a grating inside aqueous medium at various imaging rates up to 1.25 frames/s.

Item Type:	Journal Article
Publication:	IEEE-ASME TRANSACTIONS ON MECHATRONICS
Publisher:	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Additional Information:	Copy right for this article belong to IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords:	Dynamic mode atomic force microscopy (AFM); high-speed atomic forcemicroscopy; lumped parameter model; magnetic actuation; microcantilever
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	14 Nov 2018 15:11
Last Modified:	14 Nov 2018 15:11
URI:	http://eprints.iisc.ac.in/id/eprint/61065

Actions (login required)

View Item