Fracture of pre-cracked thin metallic conductors due to electric current induced electromagnetic force

Sharma, Deepak and Reddy, B Subba and Kumar, Praveen (2018) Fracture of pre-cracked thin metallic conductors due to electric current induced electromagnetic force. In: INTERNATIONAL JOURNAL OF FRACTURE, 212 (2). pp. 183-204.

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Abstract

We investigated propagation of a sharp crack in a thin metallic conductor with an edge crack due to electric current induced electromagnetic forces. Finite element method (FEM) simulations showed mode I crack opening in the edge-cracked conductor due to the aforementioned (i.e., self-induced) electromagnetic forces. Mode I stress intensity factor due to the self-induced electromagnetic forces, was evaluated numerically as , where is the magnetic permeability, l is the length of the conductor, a is the crack length, j is the current density, w is the width of the sample and f(a / w) is a geometric factor. Effect of dynamic electric current loading on edge-cracked conductor, incorporating the effects of induced currents, was also studied numerically, and dynamic stress intensity factor, , was observed to vary as . Consistent with the FEM simulation, experiments conducted using thick Al foil with an edge crack showed propagation of sharp crack due to the self-induced electromagnetic forces at pulsed current densities of for . Further, effects of current density, pulse-width and ambient temperature on the fracture behavior of the Al foil were observed experimentally and corroborated with FEM simulations.

Item Type:	Journal Article
Publication:	INTERNATIONAL JOURNAL OF FRACTURE
Publisher:	SPRINGER, VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
Additional Information:	Copy right for this article belong to SPRINGER, VAN GODEWIJCKSTRAAT 30, 3311 GZ DORDRECHT, NETHERLANDS
Department/Centre:	Division of Electrical Sciences > Electrical Engineering Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	06 Sep 2018 15:44
Last Modified:	06 Sep 2018 15:44
URI:	http://eprints.iisc.ac.in/id/eprint/60592

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