Distribution of relaxation time in solution-processed polycrystalline CZTS thin films: Study of impedance spectroscopy

Khanra, Ayantika and Gayen, R N (2018) Distribution of relaxation time in solution-processed polycrystalline CZTS thin films: Study of impedance spectroscopy. In: CERAMICS INTERNATIONAL, 44 (12). pp. 14095-14100.

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Abstract

Here we report the complex impedance spectroscopic analysis of polycrystalline CZTS thin films synthesized by sol-gel spin coating technique without any post deposition sulphurization. The films are characterized by microstructural, compositional, optical and electrical studies to confirm the formation of kesterite phase of CZTS comprises of well distributed compact grains with the optical band gap 1.44 eV. Room temperature electrical characterizations of the CZTS thin films by four-probe and Hall effect technique revealed the p-type conductivity of the films with resistivity similar to 1.45 x 10(-2) Omega cm, mobility similar to 3.7 x 10(3) cm(2) V-1 s(-1) and carrier concentration similar to 1.82 x 10(17) cm(-3). The distribution of relaxation time (DRT) function with improved frequency resolution is reconstructed from the impedance spectra of CZTS film recorded in the frequency range 50 Hz to 5 MHz at room temperature to identify the number of electrical processes in the polycrystalline film. The Nyquist plot is fitted into electrical model consist of three parallel combinations of resistor (R) and capacitor (C) in series as three major peaks in DRT function indicates the presence of different relaxation processes with major contributions from core grains along with smaller contributions from grain boundary and interfaces. The room temperature frequency dependence of dielectric constant, loss tangent and ac conductivity is also studied for the CZTS films.

Item Type:	Journal Article
Publication:	CERAMICS INTERNATIONAL
Publisher:	ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
Additional Information:	Copyright of this article belong to ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	23 Jul 2018 15:42
Last Modified:	23 Jul 2018 15:42
URI:	http://eprints.iisc.ac.in/id/eprint/60270

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