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Safety Analysis for Integrated Circuits in the Context of Hybrid Systems

Prasanth, V and Parekhji, Rubin and Amrutur, Bharadwaj (2017) Safety Analysis for Integrated Circuits in the Context of Hybrid Systems. In: IEEE International Test Conference (ITC), OCT 31-NOV 02, 2017, Fort Worth, TX.

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Official URL: http://dx.doi.org/ 10.1109/TEST.2017.8242045


Many real-life systems have integrated circuits interacting with physical systems in safety critical applications. These systems are called hybrid systems. The safety analysis of integrated circuits used in such systems is typically done in isolation of the end application and associated physical system, and hence results in the need to take recourse to conservative design techniques utilizing costly redundancy. We are gradually moving away from the paradigm of independently designing the digital and physical parts of hybrid systems towards simultaneous considerations for both. These systems have an acceptable tolerance determined by the application due to the inertial nature of the physical system, error tolerance capability in closed loop applications, built-in hardware and software functionality, etc. In this paper, we perform a comparative study of integrated circuit safety analysis as practiced today and system level application specific safety analysis that incorporates a physical system. We propose an improved method based upon the divide and conquer approach for such co-analysis to address practical limitations associated with adopting system level analysis techniques during integrated circuit design. Experimental results for a representative motor control system indicate that the application has an error tolerance of 92-160 cycles of closed loop operation for worst case errors and a control value error tolerance in the range of 5-7% at different operating conditions. Incorporation of application tolerance results in up to 4.3X reduction in the number of hardware elements which need to be protected.

Item Type: Conference Proceedings
Series.: International Test Conference Proceedings
Publisher: IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Additional Information: Copy right for the article belong to IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Interdisciplinary Sciences > Centre for Nano Science and Engineering
Date Deposited: 27 Mar 2018 18:26
Last Modified: 06 Nov 2018 07:35
URI: http://eprints.iisc.ac.in/id/eprint/59410

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