Macro and Micro-Texture Study for Understanding Whisker Growth in Sn Coatings

Jagtap, Piyush and Kumar, Praveen (2016) Macro and Micro-Texture Study for Understanding Whisker Growth in Sn Coatings. In: 18th IEEE Electronics Packaging Technology Conference (EPTC), NOV 30-DEC 03, 2016, Singapore, SINGAPORE, pp. 165-170.

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Abstract

The current work is aimed at analyzing the effects of crystallographic texture, both macro and micro-texture, on whisker growth. The macro-texture of the Sn coatings deposited on brass substrate was systematically studied by varying the process parameters used for electro-deposition. The combination of process parameters, such as deposition temperature and current density, and the resulting macro-texture most prone to whisker growth were identified by monitoring the whisker growth in Sn coatings. The electron back-scatter diffraction (EBSD) technique was then used to identify the grains where whiskers actually grow. Both macro-and micro-texture of Sn coatings revealed that coatings with pre-dominant low Miller index grain orientations, such as (100), were highly susceptible for whisker growth. Whisker propensity decreased as the texture transitioned from low to high Miller index grain orientation. The micro-texture mapping of the Sn coatings using EBSD technique confirmed that whisker grows from low Miller index grains with (100) or near (100) orientations, surrounded by grains of similar orientation followed by grains with high index plane grains, such as (211), (210) or (321). This particular double ring configuration along with local stress field can be used to predict the locations for whisker growth.

Item Type:	Conference Proceedings
Series.:	Electronics Packaging Technology Conference Proceedings
Additional Information:	Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre:	Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	16 Aug 2017 06:45
Last Modified:	16 Aug 2017 06:45
URI:	http://eprints.iisc.ac.in/id/eprint/57659

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