Computation of Mathieu stability plot for an arbitrary toroidal ion trap mass analyser

Kotana, Appala Naidu and Mohanty, Atanu K (2017) Computation of Mathieu stability plot for an arbitrary toroidal ion trap mass analyser. In: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 414 . pp. 13-22.

PDF Int_Jou_Mas_Spe_414_13_2017.pdf - Published Version Restricted to Registered users only Download (2MB) | Request a copy

Abstract

This paper presents a method to construct Mathieu stability plot for any arbitrary toroidal ion trap mass analyser. The proposed method is demonstrated on two toroidal ion trap mass analyser geometries. Two additional studies have also been carried out. These include prediction of ion secular frequency and ion trajectories at resonances in these traps. In this numerical study, toroidal multipole coefficients of the respective traps are first evaluated and these are used for computing Mathieu parameters, a and q. These Mathieu parameters are used for constructing the stability plot, predicting secular frequency of ion motion and evaluating nonlinear resonances. The stability regions of both the traps considered in this paper are qualitatively similar to the corresponding plot of the linear ion trap mass analyser. There are, however two significant differences. First, the stability plots for toroidal ion trap mass analysers have prominent resonances. Second the apices of the stability plots of the toroidal ion trap mass analysers are different from those of the linear ion trap mass analyser. The secular frequency obtained using the Mathieu parameters in this paper agrees well with those obtained numerically, except close to the stability boundaries. Finally, the prominent nonlinear resonances have been identified as beta(r) = 2/3 and beta(r) = 2/3 in both the traps. In one of the two traps there is an additional prominent nonlinear resonance at beta(r) + beta(z) =1. (C) 2016 Elsevier B.V. All rights reserved.

Item Type:	Journal Article
Publication:	INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
Additional Information:	Copy right for this article belongs to the ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	19 May 2017 10:35
Last Modified:	26 Nov 2018 15:12
URI:	http://eprints.iisc.ac.in/id/eprint/56676

Actions (login required)

View Item