Contact Mode Imaging Using AFM Probes with Exchangeable Tips

Mrinalini, Sri Muthu R and Jayanth, G R (2016) Contact Mode Imaging Using AFM Probes with Exchangeable Tips. In: 1st International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), JUL 18-21, 2016, Paris, FRANCE.

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Abstract

This paper presents the design and evaluation of an Atomic Force Microscope (AFM) probe with exchangeable tips. It can be employed to replace tips worn out during imaging, or to exchange tips during multi-step nano-metrology and manipulation tasks. The probe employs a liquid meniscus-based micro-gripper at its end to enable exchange of tips. The design of the gripper and tip-supply station are discussed and the stiffness of the gripper is analyzed. Subsequently, the system is fabricated and evaluated by performing contact mode imaging of a calibration grating. The resulting topographical image is shown to be free of artifacts, thereby underscoring the fact that the micro-gripper can grip the AFM tip adequately well to resist the effect of lateral forces in contact mode AFM. It also shows that probes with exchangeable tips can be used in applications similar to that of a conventional AFM probe.

Item Type:	Conference Proceedings
Additional Information:	Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	20 Jan 2017 04:30
Last Modified:	20 Jan 2017 04:30
URI:	http://eprints.iisc.ac.in/id/eprint/55940

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