ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

New Insights on the ESD Behavior and Failure Mechanism of Multi Wall CNTs

Mishra, Abhishek and Shrivastava, Mayank (2016) New Insights on the ESD Behavior and Failure Mechanism of Multi Wall CNTs. In: IEEE International Reliability Physics Symposium (IRPS), APR 17-21, 2016, Pasadena, CA.

[img] PDF
IEEE_Int_Rel_Phy_Sym_EL-8-1_2016.pdf - Published Version
Restricted to Registered users only

Download (685kB) | Request a copy
Official URL: http://dx.doi.org/10.1109/IRPS.2016.7574609


In this work, for the first time we experimentally determine ESD behavior of individual shells of both single and bundles of MWCNTs. Distinct electrothermal transport, under ESD conditions, through inner and outer shells of MWCNT is explored. ESD time scale current annealing behavior of outer and inner shells was discovered, which is unique to MWCNTs. Shells - by - shell failure was confirmed to be the universal failure mode of MWCNTs. Failure behaviors of suspended and collapsed (tubes resting on dielectric surface) tubes in single and bundled configuration are discussed.

Item Type: Conference Proceedings
Series.: International Reliability Physics Symposium
Additional Information: Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Electrical Sciences > Electronic Systems Engineering (Formerly Centre for Electronic Design & Technology)
Date Deposited: 07 Dec 2016 06:03
Last Modified: 07 Dec 2016 06:03
URI: http://eprints.iisc.ac.in/id/eprint/55566

Actions (login required)

View Item View Item