Discrete drops in the electrical contact resistance during nanoindentation of a bulk metallic glass

Singh, Gaurav and Narayan, RL and Asiri, AM and Ramamurty, U (2016) Discrete drops in the electrical contact resistance during nanoindentation of a bulk metallic glass. In: APPLIED PHYSICS LETTERS, 108 (18).

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Abstract

Simultaneous measurement of the electrical contact resistance (ECR) during nanoindentation of a Pd-based bulk metallic glass (BMG) shows discontinuities in the current during the loading segment. Through an analysis of the effective change in the contact area that occurs due to the plastic flow via shear banding, we show that the current surges, which are synchronous with the displacement bursts, are associated with shear band nucleation and/ or propagation. The potential of nano-ECR measurements for monitoring plastic events in BMGs is discussed. Published by AIP Publishing.

Item Type:	Journal Article
Publication:	APPLIED PHYSICS LETTERS
Publisher:	AMER INST PHYSICS
Additional Information:	Copy right of this article belongs to the AMER INST PHYSICS, 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA
Department/Centre:	Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	30 Jun 2016 05:27
Last Modified:	30 Jun 2016 05:27
URI:	http://eprints.iisc.ac.in/id/eprint/54097

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