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Surface magnetism of NiO investigated by magnetic spectromicroscopies

Mandal, Suman and Das, Jayanta and Menon, Krishnakumar SR (2016) Surface magnetism of NiO investigated by magnetic spectromicroscopies. In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 208 (SI). pp. 51-55.

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Official URL: http://dx.doi.org/10.1016/j.elspec.2015.12.007

Abstract

Antiferromagnetic (AFM) materials were not well respected from practical point of view until the discovery of interlayer exchange coupling in 1986 and giant magnetoresistance (GMR) in 1988-1989. Soon after, the old discovery (namely exchange anisotropy in 1956) and surface antiferromagnetism find their practical importance in magnetic recording, storage and sensor devices. However, the progress is partly hindered by limited experimental techniques to study surface AFM properties. This paper reviews recent experimental advances in the field of surface antiferromagnetism of prototype AFM oxide NiO(100), particularly using laterally resolved magnetic spectroscopy. Studies performed on bare NiO(100) single crystal and thin films using photoemission electron microscopy (PEEM) with X-ray magnetic linear dichroism (XMLD) as contrast mechanism and using a recently proposed approach utilizing the capability of a low energy electron microscope (LEEM), namely AFM-LEEM, are highlighted. We expect that AFM-LEEM in combination with XMLD-PEEM will soon explore more finer aspects AFM materials. (C) 2015 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Publication: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Publisher: ELSEVIER SCIENCE BV
Additional Information: Copy right for this article belongs to the ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Keywords: Antiferromagnetics; Domain walls and domain structure; Magnetic spectromicroscopy; X-ray absorption spectra
Department/Centre: Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited: 17 Jun 2016 05:24
Last Modified: 17 Jun 2016 05:24
URI: http://eprints.iisc.ac.in/id/eprint/53979

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