Bhat, Shwetha G and Kumar, Anil PS (2015) Investigation on the origin of exchange bias in epitaxial, oriented and polycrystalline Fe3O4 thin films. In: AIP ADVANCES, 5 (11).
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Abstract
We observe exchange bias (EB) in a single magnetic film Fe3O4 at temperature T < 200 K. Irrespective of crystallographic orientations of grown Fe3O4; they exhibit similar nature of EB for (100) epitaxial, (111) oriented and polycrystalline Fe3O4 thin films. Growth induced defects such as anti-phase boundaries (APBs) in epitaxial Fe3O4 thin film is known to have an influence on the magnetic interaction. But, it is noticed that according to the common consensus of APBs alone cannot explain the origin of EB. If majority of APBs end up with mainly anti-ferromagnetic interactions across these boundaries together with the internal ordering modification in Fe3O4, then EB can emerge at low temperatures. Hence, we propose the idea of directional anti-ferromagnetic APB induced EB in Fe3O4 triggered by internal ordering for T <= 200 K. Similar arguments are extended to (111) oriented as well as polycrystalline Fe3O4 films where the grain boundaries can impart same consequence as that of APBs. (C) 2015 Author(s).
Item Type: | Journal Article |
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Publication: | AIP ADVANCES |
Publisher: | AMER INST PHYSICS |
Additional Information: | Copy right for this article belongs to the AMER INST PHYSICS, 1305 WALT WHITMAN RD, STE 300, MELVILLE, NY 11747-4501 USA |
Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
Date Deposited: | 06 Jan 2016 06:17 |
Last Modified: | 06 Jan 2016 06:17 |
URI: | http://eprints.iisc.ac.in/id/eprint/53050 |
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