ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Multi-dimensional Goodness-of-Fit Tests for Spectrum Sensing Based on Stochastic Distances

Gurugopinath, Sanjeev (2014) Multi-dimensional Goodness-of-Fit Tests for Spectrum Sensing Based on Stochastic Distances. In: International Conference on Signal Processing and Communications (SPCOM), JUL 22-25, 2014, Banaglore, INDIA.

[img] PDF
2014_Int_Con_Sig_Pro_Com_2014.pdf - Published Version
Restricted to Registered users only

Download (219kB) | Request a copy
Official URL: http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumb...


In this paper, we study two multi-dimensional Goodness-of-Fit tests for spectrum sensing in cognitive radios. The multi-dimensional scenario refers to multiple CR nodes, each with multiple antennas, that record multiple observations from multiple primary users for spectrum sensing. These tests, viz., the Interpoint Distance (ID) based test and the h, f distance based tests are constructed based on the properties of stochastic distances. The ID test is studied in detail for a single CR node case, and a possible extension to handle multiple nodes is discussed. On the other hand, the h, f test is applicable in a multi-node setup. A robustness feature of the KL distance based test is discussed, which has connections with Middleton's class A model. Through Monte-Carlo simulations, the proposed tests are shown to outperform the existing techniques such as the eigenvalue ratio based test, John's test, and the sphericity test, in several scenarios.

Item Type: Conference Proceedings
Publisher: IEEE
Additional Information: Copy right for this article belongs to the IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited: 30 Dec 2015 06:07
Last Modified: 30 Dec 2015 06:07
URI: http://eprints.iisc.ac.in/id/eprint/52976

Actions (login required)

View Item View Item