ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Analysis of Constrained Piezoelectric Layer: A Two-Dimensional Coupled Electromechanical Model

Ali, R and Mahapatra, Roy D and Gopalakrishnan, S (2005) Analysis of Constrained Piezoelectric Layer: A Two-Dimensional Coupled Electromechanical Model. In: Ferroelectrics, 329 . pp. 1035-1041.

Full text not available from this repository. (Request a copy)


A new analytical model based on 2D electro-mechanical continuum coupled-field model is developed to analyze the performance of deformable thin-film capacitive sensors, surface-mounted or embedded in composite material system. Viscoelastic property of the bonding layer and the effect of constrained boundary on the capacitive performance are considered. Analytical solutions for specific cases of boundary constraints on the film, such as in-plane tensile stress, transverse normal stress and horizontal shear stress are modeled. Effect of process-induced residual stress and small crack on the capacitive performance is also studied. The results show significant complexity, which is otherwise intractable using existing simplified approaches.

Item Type: Journal Article
Publication: Ferroelectrics
Publisher: Taylor & Francis
Additional Information: Copyright for this article belongs to Taylor & Francis.
Keywords: Piezoelectric film;constraints;residual stress;crack;voltage;capacitance
Department/Centre: Division of Mechanical Sciences > Aerospace Engineering(Formerly Aeronautical Engineering)
Date Deposited: 02 Feb 2006
Last Modified: 27 Aug 2008 11:43
URI: http://eprints.iisc.ac.in/id/eprint/5278

Actions (login required)

View Item View Item