Ali, R and Mahapatra, Roy D and Gopalakrishnan, S (2005) Analysis of Constrained Piezoelectric Layer: A Two-Dimensional Coupled Electromechanical Model. In: Ferroelectrics, 329 . pp. 1035-1041.
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A new analytical model based on 2D electro-mechanical continuum coupled-field model is developed to analyze the performance of deformable thin-film capacitive sensors, surface-mounted or embedded in composite material system. Viscoelastic property of the bonding layer and the effect of constrained boundary on the capacitive performance are considered. Analytical solutions for specific cases of boundary constraints on the film, such as in-plane tensile stress, transverse normal stress and horizontal shear stress are modeled. Effect of process-induced residual stress and small crack on the capacitive performance is also studied. The results show significant complexity, which is otherwise intractable using existing simplified approaches.
| Item Type: | Journal Article |
|---|---|
| Publication: | Ferroelectrics |
| Publisher: | Taylor & Francis |
| Additional Information: | Copyright for this article belongs to Taylor & Francis. |
| Keywords: | Piezoelectric film;constraints;residual stress;crack;voltage;capacitance |
| Department/Centre: | Division of Mechanical Sciences > Aerospace Engineering(Formerly Aeronautical Engineering) |
| Date Deposited: | 02 Feb 2006 |
| Last Modified: | 27 Aug 2008 11:43 |
| URI: | http://eprints.iisc.ac.in/id/eprint/5278 |
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