ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Patch-based and multiresolution optimum bilateral filters for denoising images corrupted by Gaussian noise

Kishan, Harini and Seelamantula, Chandra Sekhar (2015) Patch-based and multiresolution optimum bilateral filters for denoising images corrupted by Gaussian noise. In: JOURNAL OF ELECTRONIC IMAGING, 24 (5).

[img] PDF
Jou_of_Ele_Ima_24-5_053021_2015.pdf - Published Version
Restricted to Registered users only

Download (2MB) | Request a copy
Official URL: http://dx.doi.org/10.1117/1.JEI.24.5.053021


We propose optimal bilateral filtering techniques for Gaussian noise suppression in images. To achieve maximum denoising performance via optimal filter parameter selection, we adopt Stein's unbiased risk estimate (SURE)-an unbiased estimate of the mean-squared error (MSE). Unlike MSE, SURE is independent of the ground truth and can be used in practical scenarios where the ground truth is unavailable. In our recent work, we derived SURE expressions in the context of the bilateral filter and proposed SURE-optimal bilateral filter (SOBF). We selected the optimal parameters of SOBF using the SURE criterion. To further improve the denoising performance of SOBF, we propose variants of SOBF, namely, SURE-optimal multiresolution bilateral filter (SMBF), which involves optimal bilateral filtering in a wavelet framework, and SURE-optimal patch-based bilateral filter (SPBF), where the bilateral filter parameters are optimized on small image patches. Using SURE guarantees automated parameter selection. The multiresolution and localized denoising in SMBF and SPBF, respectively, yield superior denoising performance when compared with the globally optimal SOBF. Experimental validations and comparisons show that the proposed denoisers perform on par with some state-of-the-art denoising techniques. (C) 2015 SPIE and IS&T

Item Type: Journal Article
Publisher: IS&T & SPIE
Additional Information: Copy right for this article belongs to the IS&T & SPIE, 1000 20TH ST, BELLINGHAM, WA 98225 USA
Keywords: bilateral filter; multiresolution bilateral filter; Stein's unbiased risk estimate
Department/Centre: Division of Electrical Sciences > Electrical Engineering
Date Deposited: 30 Oct 2015 06:53
Last Modified: 30 Oct 2015 06:53
URI: http://eprints.iisc.ac.in/id/eprint/52647

Actions (login required)

View Item View Item