ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Measuring the linewidth of a stabilized diode laser

Muanzuala, Lal and Ravi, Harish and Sylvan, Karthik and Natarajan, Vasant (2015) Measuring the linewidth of a stabilized diode laser. In: CURRENT SCIENCE, 109 (4). pp. 765-767.

[img] PDF
Cur_Sci_109-4_765_2015.pdf - Published Version
Restricted to Registered users only

Download (688kB) | Request a copy
Official URL: http://www.currentscience.ac.in/Volumes/109/04/076...


We demonstrate a straightforward technique to measure the linewidth of a grating-stabilized diode laser system - known as an external cavity diode laser (ECDL) - by beating the output of two independent ECDLs in a Michelson interferometer, and then taking the Fourier transform of the beat signal. The measured linewidth is the sum of the linewidths of the two laser systems. Assuming that the two are equal, we find that the linewidth of each ECDL measured over a time period of 2. s is about 0.3 MHz. This narrow linewidth shows the advantage of using such systems for high-resolution spectroscopy and other experiments in atomic physics.

Item Type: Journal Article
Additional Information: Copy right for this article belongs to the INDIAN ACAD SCIENCES, C V RAMAN AVENUE, SADASHIVANAGAR, P B #8005, BANGALORE 560 080, INDIA
Keywords: Diode laser; grating stabilization; interferometer; linewidth; Littrow configuration
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 24 Sep 2015 07:18
Last Modified: 24 Sep 2015 07:18
URI: http://eprints.iisc.ac.in/id/eprint/52451

Actions (login required)

View Item View Item