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A novel interferometric technique to estimate thermal diffusivity of `optically transparent solid' using `Isothermal surface velocimetry'

Balachandar, Settu and Shivaprakash, NC and Rao, Kameswara L (2015) A novel interferometric technique to estimate thermal diffusivity of `optically transparent solid' using `Isothermal surface velocimetry'. In: 3rd Conference of the Optics-and-Photonics-Society-of-Singapore / International Conference on Optical and Photonic Engineering (icOPEN), APR 14-16, 2015, Singapore, SINGAPORE.

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Official URL: http://dx.doi.org/10.1117/12.2189532


One-dimensional transient heat flow is interpreted as a procession of `macro-scale translatory motion of indexed isothermal surfaces'. A new analytical model is proposed by introducing velocity of isothermal surface in Fourier heat diffusion equation. The velocity dependent function is extracted by revisiting `the concept of thermal layer of heat conduction in solid' and `exact solution' to estimate thermal diffusivity. The experimental approach involves establishment of 1 D unsteady heat flow inside the sample through Step-temperature excitation. A novel self-reference interferometer is utilized to separate a `unique isothermal surface' in time-varying temperature field. The translatory motion of the said isothermal surface is recorded using digital camera to estimate its velocity. From the knowledge of thermo-optic coefficient, temperature of the said isothermal surface is predicted. The performance of proposed method is evaluated for Quartz sample and compared with literature.

Item Type: Conference Proceedings
Series.: Proceedings of SPIE
Additional Information: Copy right for this article belongs to the SPIE-INT SOC OPTICAL ENGINEERING, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA
Keywords: Self-Reference Interferometer; laser crystal; Quartz glass; Fourier heat diffusion; Thermal diffusivity; Step-temperature excitation; thermo-optic coefficient; Isothermal surface
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 11 Sep 2015 05:01
Last Modified: 11 Sep 2015 05:01
URI: http://eprints.iisc.ac.in/id/eprint/52339

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