Effects of Patterned Substrate on Thin Films Simulated by Family Model

Chanphana, R and Chatraphorn, P and Dasgupta, C (2015) Effects of Patterned Substrate on Thin Films Simulated by Family Model. In: JOURNAL OF STATISTICAL PHYSICS, 160 (2). pp. 397-408.

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Abstract

Patterned substrate growth has been a subject of much interest. In this work, characteristics of some statistical properties of a film grown on triangular and vicinal substrates using the Family model are studied. Substrate size and tilt angle are varied. It is found that the interface width and the correlation function increase as the roughness of the pattern is increased. The new scaling exponents are calculated and anomalous scaling is obtained. The transient persistence probability does not show a power law relation when the initial surface is sufficiently rough. The initial rough surface also causes multifractal behavior in the model.

Item Type:	Journal Article
Publication:	JOURNAL OF STATISTICAL PHYSICS
Publisher:	SPRINGER
Additional Information:	Copy right for this article belongs to the SPRINGER, 233 SPRING ST, NEW YORK, NY 10013 USA
Keywords:	Patterned substrate; Discrete growth models; Persistence probability; Correlation function
Department/Centre:	Division of Physical & Mathematical Sciences > Physics
Date Deposited:	31 Jul 2015 10:50
Last Modified:	31 Jul 2015 10:50
URI:	http://eprints.iisc.ac.in/id/eprint/51946

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