Manikandan, RR and Amrutur, Bharadwaj (2015) A zero charge-pump mismatch current tracking loop for reference spur reduction in PLLs. In: MICROELECTRONICS JOURNAL, 46 (6). pp. 422-430.
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Abstract
The charge-pump (CP) mismatch current is a dominant source of static phase error and reference spur in the nano-meter CMOS PLL implementations due to its worsened channel length modulation effect. This paper presents a charge-pump (CP) mismatch current reduction technique utilizing an adaptive body bias tuning of CP transistors and a zero CP mismatch current tracking PLL architecture for reference spur suppression. A chip prototype of the proposed circuit was implemented in 0.13 mu m CMOS technology. The frequency synthesizer consumes 8.2 mA current from a 13 V supply voltage and achieves a phase noise of -96.01 dBc/Hz @ 1 MHz offset from a 2.4 GHz RF carrier. The charge-pump measurements using the proposed calibration technique exhibited a mismatch current of less than 0.3 mu A (0.55%) over the VCO control voltage range of 0.3-1.0 V. The closed loop measurements show a minimized static phase error of within +/- 70 ps and a similar or equal to 9 dB reduction in reference spur level across the PLL output frequency range 2.4-2.5 GHz. The presented CP calibration technique compensates for the DC current mismatch and the mismatch due to channel length modulation effect and therefore improves the performance of CP-PLLs in nano-meter CMOS implementations. (C) 2015 Elsevier Ltd. All rights reserved.
Item Type: | Journal Article |
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Publication: | MICROELECTRONICS JOURNAL |
Publisher: | ELSEVIER SCI LTD |
Additional Information: | Copy right for this article belongs to the ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND |
Keywords: | Phase-locked loop (PLL); Charge-pump; Current mismatch; Reference spur; Deterministic jitter; Static phase offset |
Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 19 Jul 2015 09:20 |
Last Modified: | 19 Jul 2015 09:20 |
URI: | http://eprints.iisc.ac.in/id/eprint/51821 |
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