Transport studies on La0.8-xPr0.2SrxMnO3 manganite films

Solanki, PS and Doshi, RR and Ravalia, Ashish and Keshvani, MJ and Pandya, Swati and Ganesan, V and Shah, NA and Kuberkar, DG (2015) Transport studies on La0.8-xPr0.2SrxMnO3 manganite films. In: PHYSICA B-CONDENSED MATTER, 465 . pp. 71-80.

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Abstract

In this communication, we report the results of the studies on structural, microstructural, transport and magnetotransport behavior of L0.8-xPr0.2SrxMnO3 (LPSMO) (x=0.1, 0.2 and 0.3) manganite films grown on (100) single crystalline SrTiO3 (STO) substrate using low cost chemical solution deposition (CSD) method. Films with similar compositions were also grown using sophisticated pulsed laser deposition (PLD) technique and results of structural and transport studies obtained for CSD grown films were compared with PLD grown films. Structural studies show that all the CSD and PLD grown films possess single crystalline nature with compressive and tensile strain, respectively. Surface morphology, studied using atomic force microscope (AFM), reveals the island like grain morphology in CSD grown films while PLD grown films possess smooth film surfaces. Carrier density dependent transport properties of the films have been discussed in the context of zener double exchange (ZDE) mechanism. Lower resistivity and higher transition temperature (T-p) observed in CSD grown films as compared to PLD grown films have been discussed in the light of structural strain and surface morphology of the films. Various models and mechanisms have been employed to understand the charge transport in CSD and PLD grown films. Also, observation of low temperature resistivity minima behavior in all the CSD and PLD grown LPSMO films has been explained in the context of electron-electron scattering mechanism. (C) 2015 Elsevier B.V. All rights reserved.

Item Type:	Journal Article
Publication:	PHYSICA B-CONDENSED MATTER
Publisher:	ELSEVIER SCIENCE BV
Additional Information:	Copy right for this article belongs to the ELSEVIER SCIENCE BV, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS
Keywords:	Thin films; Chemical synthesis; X-ray diffraction; Electrical properties
Department/Centre:	Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited:	28 Apr 2015 07:11
Last Modified:	28 Apr 2015 07:11
URI:	http://eprints.iisc.ac.in/id/eprint/51414

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