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Group Testing-Based Spectrum Hole Search for Cognitive Radios

Sharma, Abhay and Murthy, Chandra R (2014) Group Testing-Based Spectrum Hole Search for Cognitive Radios. In: IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, 63 (8). pp. 3794-3805.

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Official URL: http://dx.doi.org/ 10.1109/TVT.2014.2305978

Abstract

This paper investigates the use of adaptive group testing to find a spectrum hole of a specified bandwidth in a given wideband of interest. We propose a group testing-based spectrum hole search algorithm that exploits sparsity in the primary spectral occupancy by testing a group of adjacent subbands in a single test. This is enabled by a simple and easily implementable sub-Nyquist sampling scheme for signal acquisition by the cognitive radios (CRs). The sampling scheme deliberately introduces aliasing during signal acquisition, resulting in a signal that is the sum of signals from adjacent subbands. Energy-based hypothesis tests are used to provide an occupancy decision over the group of subbands, and this forms the basis of the proposed algorithm to find contiguous spectrum holes of a specified bandwidth. We extend this framework to a multistage sensing algorithm that can be employed in a variety of spectrum sensing scenarios, including noncontiguous spectrum hole search. Furthermore, we provide the analytical means to optimize the group tests with respect to the detection thresholds, number of samples, group size, and number of stages to minimize the detection delay under a given error probability constraint. Our analysis allows one to identify the sparsity and SNR regimes where group testing can lead to significantly lower detection delays compared with a conventional bin-by-bin energy detection scheme; the latter is, in fact, a special case of the group test when the group size is set to 1 bin. We validate our analytical results via Monte Carlo simulations.

Item Type: Journal Article
Publication: IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
Additional Information: Copyright for this article belongs to the IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited: 14 Dec 2014 11:00
Last Modified: 14 Dec 2014 11:00
URI: http://eprints.iisc.ac.in/id/eprint/50448

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