Three-dimensional profiling using a still shot

Kondiparthi, Mahesh (2014) Three-dimensional profiling using a still shot. In: JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 13 (1).

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Abstract

A method to reliably extract object profiles even with surface discontinuities that leads to 2n pi phase jumps is proposed. The proposed method uses an amplitude-modulated Ronchi grating, which allows one to extract phase and unwrap the same with a single image. Ronchi equivalent image can be derived from modified grating image, which aids in extracting wrapped phase using Fourier transform profilometry. The amplitude of the modified grating aids in phase unwrapping. As we only need a projector that projects an amplitude-modulated grating, the proposed method allows one to extract three-dimensional profile without using full video projectors. This article also deals with noise reduction algorithms for fringe projection techniques. (C) 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)

Item Type:	Journal Article
Publication:	JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS
Publisher:	SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
Additional Information:	Copy right for this article belongs to the SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98225 USA
Keywords:	ramp amplitude-modulated Ronchi grating; grating with linearly varying amplitude; linearly damped Ronchi grating three-dimensional profile; 2n pi phase jumps
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	14 Aug 2014 11:13
Last Modified:	14 Aug 2014 11:13
URI:	http://eprints.iisc.ac.in/id/eprint/49571

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