ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Using Relationships for Matching Textual Domain Models with Existing Code

Komondoor, Raghavan and Bhattacharya, Indrajit and D'Souza, Deepak and Kale, Sachin (2013) Using Relationships for Matching Textual Domain Models with Existing Code. In: 20th Working Conference on Reverse Engineering, OCT 14-17, 2013, Univ Koblenz, Koblenz, GERMANY, pp. 371-380.

[img] PDF
20th_wor_con-rev_eng_371_2013.pdf - Published Version
Restricted to Registered users only

Download (258kB) | Request a copy
Official URL: http://dx.doi.org/10.1109/WCRE.2013.6671312


We address the task of mapping a given textual domain model (e.g., an industry-standard reference model) for a given domain (e.g., ERP), with the source code of an independently developed application in the same domain. This has applications in improving the understandability of an existing application, migrating it to a more flexible architecture, or integrating it with other related applications. We use the vector-space model to abstractly represent domain model elements as well as source-code artifacts. The key novelty in our approach is to leverage the relationships between source-code artifacts in a principled way to improve the mapping process. We describe experiments wherein we apply our approach to the task of matching two real, open-source applications to corresponding industry-standard domain models. We demonstrate the overall usefulness of our approach, as well as the role of our propagation techniques in improving the precision and recall of the mapping task.

Item Type: Conference Proceedings
Series.: Working Conference on Reverse Engineering
Publisher: IEEE
Additional Information: copyright for this article belongs to IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
Department/Centre: Division of Electrical Sciences > Computer Science & Automation
Date Deposited: 26 May 2014 11:37
Last Modified: 26 May 2014 11:37
URI: http://eprints.iisc.ac.in/id/eprint/49001

Actions (login required)

View Item View Item