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Laser- induced optical properties change in Sb10S40Se50 chalcogenide thin films: An investigation through FTIR and XPS measurements

Naik, Ramakanta and Jena, Shuvendu and Ganesan, R and Sahoo, NK (2014) Laser- induced optical properties change in Sb10S40Se50 chalcogenide thin films: An investigation through FTIR and XPS measurements. In: PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 251 (3). pp. 661-668.

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Official URL: http://dx.doi.org/10.1002/pssb.201350060


Chalcogenide glasses are interesting materials for their infrared transmitting properties and photo-induced effects. This paper reports the influence of light on the optical properties of Sb10S40Se50 thin films. The amorphous nature and chemical composition of the deposited film was studied by X-ray diffraction and energy dispersive X-ray analysis (EDAX). The optical constants, i.e., refractive index, extinction coefficient, and optical band gap as well as film thickness are determined from the measured transmission spectra using the Swanepoel method. The dispersion of the refractive index is discussed in terms of the single-oscillator Wemple-DiDomenico model. The dispersion energy parameter was found to be less for the laser-irradiated film, which indicates the laser-irradiated film is more microstructurally disordered as compared to the as-prepared film. It is observed that laser-irradiation of the films leads to decrease in optical band gap (photo-darkening) while increase in refractive index. The decrease in the optical band gap is explained on the basis of change in nature of films due to chemical disorderness and the increase in refractive index may be due to the densification of films with improved grain structure because of microstructural disorderness in the films. The optical changes are supported by X-ray photoelectron spectroscopy data. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Item Type: Journal Article
Additional Information: Copyright for this article belongs to the WILEY-V C H VERLAG GMBH, GERMANY
Keywords: chalcogenides; infrared spectroscopy; optical properties; thin films; X-ray photoelectron spectroscopy
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 13 May 2014 07:11
Last Modified: 13 May 2014 07:11
URI: http://eprints.iisc.ac.in/id/eprint/48960

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