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Nanostructured CexZn1-xO thin films: Influence of Ce doping on the structural, optical and electrical properties

Mariappan, R and Ponnuswamy, V and Suresh, P and Suresh, R and Ragavendar, M and Bose, Chandra A (2014) Nanostructured CexZn1-xO thin films: Influence of Ce doping on the structural, optical and electrical properties. In: JOURNAL OF ALLOYS AND COMPOUNDS, 588 . pp. 170-176.

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Official URL: http://dx.doi.org/10.1016/j.jallcom.2013.10.210


Thin films of CexZn1-xO thin films were deposited on glass substrates at 400 degrees C by nebulizer spray pyrolysis technique. Ce doping concentration (x) was varied from 0 to 10%, in steps of 2.5%. X-ray diffraction reveals that all the films have polycrystalline nature with hexagonal crystal structure and high preferential orientation along (002) plane. Optical parameters such as; transmittance, band gap energy, refractive index (n), extinction coefficient (k), complex dielectric constants (epsilon(r), epsilon(i)) and optical conductivity (sigma(r), sigma(i)) have been determined and discussed with respect to Ce concentration. All the films exhibit transmittance above 80% in the wavelength range from 330 to 2500 nm. Optical transmission measurements indicate the decrease of direct band gap energy from 3.26 to 3.12 eV with the increase of Ce concentration. Photoluminescence spectra show strong near band edge emission centered similar to 398 nm and green emission centered similar to 528 nm with excitation wavelength similar to 350 nm. High resolution scanning electron micrographs indicate the formation of vertical nano-rod like structures on the film surface with average diameter similar to 41 nm. Electrical properties of the Ce doped ZnO film have been studied using ac impedance spectroscopy in the frequency range from 100 Hz-1 MHz at different temperatures. (C) 2013 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Additional Information: Copyright for this article belongs to the ELSEVIER SCIENCE SA, SWITZERLAND
Keywords: Nebulizer spray pyrolysis; X-ray diffraction; Scanning electron microscopy; Optical properties; Electrical properties
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 25 Feb 2014 08:31
Last Modified: 25 Feb 2014 08:32
URI: http://eprints.iisc.ac.in/id/eprint/48458

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