Current rectification by a single ZnS nanorod probed using a scanning tunneling microscopic technique

Thupakula, Umamahesh and Bal, Jayanta K. and Dalui, Amit and Debangshi, Anupam and Sarma, DD and Acharya, Somobrata (2014) Current rectification by a single ZnS nanorod probed using a scanning tunneling microscopic technique. In: JOURNAL OF MATERIALS CHEMISTRY C, 2 (6). pp. 1158-1164.

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Abstract

We report on the rectification properties from a single ZnS nanorod measured using the UHV-SPM technique. The rectification behavior is evidenced from the current-voltage characteristics measured on a single ZnS nanorod. We propose a tunneling mechanism where the direct tunneling mechanism is dominant at lower applied bias voltages followed by resonant tunneling through discrete energy levels of the nanorod. A further increase in the bias voltage changes the tunneling mechanism to the Fowler-Nordheim tunneling regime enabling rectification behavior. Realizing rectification from a single ZnS nanorod may provide a means of realizing a single nanorod based miniaturized device.

Item Type:	Journal Article
Publication:	JOURNAL OF MATERIALS CHEMISTRY C
Publisher:	ROYAL SOC CHEMISTRY
Additional Information:	Copyright for this article belongs to the ROYAL SOC CHEMISTRY, ENGLAND
Department/Centre:	Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited:	21 Feb 2014 08:48
Last Modified:	21 Feb 2014 08:48
URI:	http://eprints.iisc.ac.in/id/eprint/48427

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