Murugan, Rajen and Mukherjee, Souvik and Mi, Minhong and Pauc, Lionel and Girardi, Claudio (2012) System-level SoC near-field (NF) emissions: Simulation to measurement correlation. In: 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC), May 29 2012-June 1 2012, San Diego, CA.
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Abstract
As System-on-Chip (SoC) designs migrate to 28nm process node and beyond, the electromagnetic (EM) co-interactions of the Chip-Package-Printed Circuit Board (PCB) becomes critical and require accurate and efficient characterization and verification. In this paper a fast, scalable, and parallelized boundary element based integral EM solutions to Maxwell equations is presented. The accuracy of the full-wave formulation, for complete EM characterization, has been validated on both canonical structures and real-world 3-D system (viz. Chip + Package + PCB). Good correlation between numerical simulation and measurement has been achieved. A few examples of the applicability of the formulation to high speed digital and analog serial interfaces on a 45nm SoC are also presented.
Item Type: | Conference Paper |
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Publisher: | IEEE |
Additional Information: | Copyright of this article belongs to IEEE. |
Department/Centre: | Division of Electrical Sciences > Electrical Communication Engineering |
Date Deposited: | 19 Dec 2013 09:49 |
Last Modified: | 19 Dec 2013 09:49 |
URI: | http://eprints.iisc.ac.in/id/eprint/48029 |
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