Evaluation of document binarization using eigen value decomposition

Kumar, Deepak and Prasad, MN Anil and Ramakrishnan, AG (2013) Evaluation of document binarization using eigen value decomposition. In: 20th Conference on Document Recognition and Retrieval (DRR) held as part of the IS and T/SPIE Symposium on Electronic Imaging, FEB 05-07, 2013 , San Francisco, CA.

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Abstract

A necessary step for the recognition of scanned documents is binarization, which is essentially the segmentation of the document. In order to binarize a scanned document, we can find several algorithms in the literature. What is the best binarization result for a given document image? To answer this question, a user needs to check different binarization algorithms for suitability, since different algorithms may work better for different type of documents. Manually choosing the best from a set of binarized documents is time consuming. To automate the selection of the best segmented document, either we need to use ground-truth of the document or propose an evaluation metric. If ground-truth is available, then precision and recall can be used to choose the best binarized document. What is the case, when ground-truth is not available? Can we come up with a metric which evaluates these binarized documents? Hence, we propose a metric to evaluate binarized document images using eigen value decomposition. We have evaluated this measure on DIBCO and H-DIBCO datasets. The proposed method chooses the best binarized document that is close to the ground-truth of the document.

Item Type:	Conference Proceedings
Series.:	Proceedings of SPIE
Publisher:	SPIE-INT SOC OPTICAL ENGINEERING
Additional Information:	copyright for this article belongs to SPIE-INT SOC OPTICAL ENGINEERING San Francisco, CA,.
Keywords:	binarization; evaluation; eigen value decomposition; threshold; degraded documents; document quality measure
Department/Centre:	Division of Electrical Sciences > Electrical Engineering
Date Deposited:	03 Jan 2014 11:06
Last Modified:	03 Jan 2014 11:06
URI:	http://eprints.iisc.ac.in/id/eprint/48006

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