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A two-axis in-plane motion measurement system based on optical beam deflection

Sriramshankar, R and Mrinalini, R Sri Muthu and Jayanth, GR (2013) A two-axis in-plane motion measurement system based on optical beam deflection. In: REVIEW OF SCIENTIFIC INSTRUMENTS, 84 (10).

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Official URL: http://dx.doi.org/10.1063/1.4824357


Measurement of in-plane motion with high resolution and large bandwidth enables model-identification and real-time control of motion-stages. This paper presents an optical beam deflection based system for measurement of in-plane motion of both macro- and micro-scale motion stages. A curved reflector is integrated with the motion stage to achieve sensitivity to in-plane translational motion along two axes. Under optimal settings, the measurement system is shown to theoretically achieve sub-angstrom measurement resolution over a bandwidth in excess of 1 kHz and negligible cross-sensitivity to linear motion. Subsequently, the proposed technique is experimentally demonstrated by measuring the in-plane motion of a piezo flexure stage and a scanning probe microcantilever. For the former case, reflective spherical balls of different radii are employed to measure the in-plane motion and the measured sensitivities are shown to agree with theoretical values, on average, to within 8.3%. For the latter case, a prototype polydimethylsiloxane micro-reflector is integrated with the microcantilever. The measured in-plane motion of the microcantilever probe is used to identify nonlinearities and the transient dynamics of the piezo-stage upon which the probe is mounted. These are subsequently compensated by means of feedback control. (C) 2013 AIP Publishing LLC.

Item Type: Journal Article
Additional Information: copyright for this article belongs to AMER INST PHYSICS USA
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 28 Dec 2013 06:14
Last Modified: 28 Dec 2013 06:14
URI: http://eprints.iisc.ac.in/id/eprint/47985

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