Chopade, SS and Barve, SA and Raman, KH Thulasi and Chand, N and Deo, MN and Biswas, A and Rai, Sanjay and Lodha, GS and Rao, GM and Patil, DS (2013) RF plasma MOCVD of Y2O3 thin films: Effect of RF self-bias on the substrates during deposition. In: APPLIED SURFACE SCIENCE, 285 (B). pp. 524-531.
|
PDF
App-Sci_285- 524_2013.pdf - Published Version Download (2MB) | Preview |
Abstract
Yttrium oxide (Y203) thin films have been deposited by radio frequency plasma assisted metal organic chemical vapor deposition (MOCVD) process using (2,2,6,6-tetramethy1-3,5-heptanedionate) yttrium (commonly known as Y(thd)3) precursor in a plasma of argon and oxygen gases at a substrate temperature of 350 C. The films have been deposited under influence of varying RF self-bias (-50 V to 175 V) on silicon, quartz, stainless steel and tantalum substrates. The deposited coatings are characterized by glancing angle X-ray diffraction (GIXRD), Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), spectroscopic ellipsometry and scanning electron microscopy (SEM). GIXRD and FTIR results indicate deposition of Y2 03 (BCC structure) in all cases. However, XPS results indicate nonstoichiometric cubic phase deposition on the surface of deposited films. The degree of nonstoichiometry varies with bias during deposition. Ellipsometry results indicate that the refractive index for the deposited films is varying from 1.70 to 1.83 that is typical for Y203. All films are transparent in the investigated wavelength range 300-1200 nm. SEM results indicate that the microstructure of the films is changing with applied bias. Results indicate that it is possible to deposit single phase cubic Y203 thin films at low substrate temperature by RF plasma MOCVD process. RF self-bias that decides about the energy of impinging ions on the substrates plays an important role in controlling the texture of deposited Y203 films on the substrates. Results indicate that to control the structure of films and its texture, it is important to control the bias on the substrate during deposition. The films deposited at high bias level show degradation in the crystallinity and reduction of thickness. (C) 2013 Elsevier B.V. All rights reserved.
| Item Type: | Journal Article |
|---|---|
| Publication: | APPLIED SURFACE SCIENCE |
| Publisher: | ELSEVIER SCIENCE BV |
| Additional Information: | copyright for this article belongs to ELSEVIER SCIENCE, NETHERLANDS |
| Keywords: | Y2O3; MOCVD; XPS; RF plasma |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics |
| Date Deposited: | 19 Dec 2013 10:22 |
| Last Modified: | 19 Dec 2013 10:22 |
| URI: | http://eprints.iisc.ac.in/id/eprint/47948 |
Actions (login required)
 |
View Item |
