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Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers

Knut, Ronny and Svedlindh, Peter and Mryasov, Oleg and Gunnarsson, Klas and Warnicke, Peter and Arena, DA and Bjoerck, Matts and Dennison, Andrew JC and Sahoo, Anindita and Mukherjee, Sumanta and Sarma, DD and Granroth, Sari and Gorgoi, Mihaela and Karis, Olof (2013) Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers. In: PHYSICAL REVIEW B, 88 (13).

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Official URL: http://dx.doi.org/10.1103/PhysRevB.88.134407


To address the amount of disorder and interface diffusion induced by annealing, all-Heusler multilayer structures, consisting of ferromagnetic Co2MnGe and nonmagnetic Rh2CuSn layers of varying thicknesses, have been investigated by means of hard x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism. We find evidence for a 4 angstrom thick magnetically dead layer that, together with the identified interlayer diffusion, are likely reasons for the unexpectedly small magnetoresistance found for current-perpendicular-to-plane giant magnetoresistance devices based on this all-Heusler system. We find that diffusion begins already at comparably low temperatures between 200 and 250 degrees C, where Mn appears to be most prone to diffusion.

Item Type: Journal Article
Additional Information: copyright for this article belongs to APS
Department/Centre: Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 13 Nov 2013 10:51
Last Modified: 13 Nov 2013 10:51
URI: http://eprints.iisc.ac.in/id/eprint/47742

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