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Frustration induced oscillator death on networks

Gade, Prashant M and Rangarajan, Govindan (2013) Frustration induced oscillator death on networks. In: CHAOS, 23 (3).

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Official URL: http://dx.doi.org/10.1063/1.4812797

Abstract

An array of identical maps with Ising symmetry, with both positive and negative couplings, is studied. We divide the maps into two groups, with positive intra-group couplings and negative inter-group couplings. This leads to antisynchronization between the two groups which have the same stability properties as the synchronized state. Introducing a certain degree of randomness in signs of these couplings destabilizes the anti-synchronized state. Further increasing the randomness in signs of these couplings leads to oscillator death. This is essentially a frustration induced phenomenon. We explain the observed results using the theory of random matrices with nonzero mean. We briefly discuss applications to coupled differential equations. (C) 2013 AIP Publishing LLC.

Item Type: Journal Article
Publication: CHAOS
Publisher: AMER INST PHYSICS
Additional Information: copyright for this article belongs to AIP
Department/Centre: Division of Biological Sciences > Centre for Neuroscience
Division of Physical & Mathematical Sciences > Mathematics
Date Deposited: 06 Nov 2013 06:10
Last Modified: 06 Nov 2013 06:10
URI: http://eprints.iisc.ac.in/id/eprint/47687

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