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Deposition and characterization of pure and Cd doped SnO2 thin films by the nebulizer spray pyrolysis (NSP) technique

Mariappan, R and Ponnuswamy, V and Suresh, P and Suresh, R and Ragavendar, M and Sankar, C (2013) Deposition and characterization of pure and Cd doped SnO2 thin films by the nebulizer spray pyrolysis (NSP) technique. In: Materials Science in Semiconductor Processing, 16 (3). pp. 825-832.

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Official URL: http://dx.doi.org/10.1016/j.mssp.2013.01.006


Pure and cadmium doped tin oxide thin films were deposited on glass substrates from aqueous solution of cadmium acetate, tin (IV) chloride and sodium hydroxide by the nebulizer spray pyrolysis (NSP) technique. X-ray diffraction reveals that all films have tetragonal crystalline structure with preferential orientation along (200) plane. On application of the Scherrer formula, it is found that the maximum size of grains is 67 nm. Scanning electron microscopy shows that the grains are of rod and spherical in shape. Energy dispersive X-ray analysis reveals the average ratio of the atomic percentage of pure and Cd doped SnO2 films. The electrical resistivity is found to be 10(2) Omega cm at higher temperature (170 degrees C) and 10(3) Omega cm at lower temperature (30 degrees C). Optical band gap energy was determined from transmittance and absorbance data obtained from UV-vis spectra. Optical studies reveal that the band gap energy decreases from 3.90 eV to 3.52 eV due to the addition of Cd as dopant with different concentrations.

Item Type: Journal Article
Publication: Materials Science in Semiconductor Processing
Publisher: Elsevier Science
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: Nebulizer Spray Pyrolysis; XRD; SEM; Electrical; Optical Properties
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 11 Jul 2013 06:20
Last Modified: 11 Jul 2013 06:20
URI: http://eprints.iisc.ac.in/id/eprint/46814

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