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Optical and structural properties of nanostructured oxide thin films by sol‐gel technique

Kareem, KSA and Rao, Narasimha K and Phani, AR and Rani, Uma R and Sharma, AK (2011) Optical and structural properties of nanostructured oxide thin films by sol‐gel technique. In: OPTICS: PHENOMENA, MATERIALS, DEVICES, AND CHARACTERIZATION: OPTICS 2011: International Conference on Light, 23–25 May 2011, Calicut, Kerala, (India).

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Official URL: http://dx.doi.org/10.1063/1.3643623


TiO2 and Al2O3 are commonly used materials in optical thin films in the visible and near‐infrared wavelength region due to their high transparency and good stability. In this work, TiO2 and Al2O3 single, and nano composite thin films with different compositions were deposited on glass and silicon substrates at room temperature using a sol‐gel spin coater. The optical properties like reflectance, transmittance and refractive index have been studied using Spectrophotometer, and structural properties using X‐Ray Diffraction (XRD) and Scanning Electron Microscopy (SEM).

Item Type: Conference Proceedings
Publisher: American Institute of Physics
Additional Information: Copyright of this article belongs to American Institute of Physics.
Keywords: Nanostructured Materials; Sol-Gel Processing; Refractive Index; Annealing;X-Ray Diffraction
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 01 May 2013 10:20
Last Modified: 01 May 2013 10:20
URI: http://eprints.iisc.ac.in/id/eprint/46274

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