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A high precision instrument to measure angular and binocular deviation introduced by aircraft windscreens by using a shadow casting technique

Shivananju, BN and Yamdagni, S and Vasu, RM and Asokan, S (2012) A high precision instrument to measure angular and binocular deviation introduced by aircraft windscreens by using a shadow casting technique. In: REVIEW OF SCIENTIFIC INSTRUMENTS, 83 (12).

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Official URL: http://dx.doi.org/10.1063/1.4769756

Abstract

Objects viewed through transparent sheets with residual non-parallelism and irregularity appear shifted and distorted. This distortion is measured in terms of angular and binocular deviation of an object viewed through the transparent sheet. The angular and binocular deviations introduced are particularly important in the context of aircraft windscreens and canopies as they can interfere with decision making of pilots especially while landing, leading to accidents. In this work, we have developed an instrument to measure both the angular and binocular deviations introduced by transparent sheets. This instrument is especially useful in the qualification of aircraft windscreens and canopies. It measures the deviation in the geometrical shadow cast by a periodic dot pattern trans-illuminated by the distorted light beam from the transparent test specimen compared to the reference pattern. Accurate quantification of the shift in the pattern is obtained by cross-correlating the reference shadow pattern with the specimen shadow pattern and measuring the location of the correlation peak. The developed instrument is handy to use and computes both angular and binocular deviation with an accuracy of less than +/- 0.1 mrad (approximate to 0.036 mrad) and has an excellent repeatability with an error of less than 2%. (C) 2012 American Institute of Physics. http://dx.doi.org/10.1063/1.4769756]

Item Type: Journal Article
Publication: REVIEW OF SCIENTIFIC INSTRUMENTS
Publisher: AMER INST PHYSICS
Additional Information: Copy right for this article belongs to AMER INST PHYSICS, MELVILLE, USA
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited: 04 Feb 2013 10:58
Last Modified: 04 Feb 2013 10:58
URI: http://eprints.iisc.ac.in/id/eprint/45736

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