Chakradhar, RPS and Kumar, Dinesh V and Shivakumara, C and Rao, JL and Basu, Bharathibai J (2012) Characterisation of microstructure and evaluation of optical and EPR properties of superhydrophobic copper dodecanoate films. In: Surface and Interface Analysis, 44 (4). pp. 412-417.
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Abstract
Copper dodecanoate films prepared by emulsion method exhibit superhydrophobic property with water contact angle of 155 degrees and sliding angle of <2 degrees. The films have been characterised by using X-ray diffraction, field emission scanning electron microscopy and Fourier transform infrared spectroscopy techniques. Surface microstructure of copper dodecanoate consists of numerous microscale papillas of about 6-12 mu m in length with a diameter in the range of 360-700 nm. The superhydrophobicity of the films is due to their dual micronano surface morphology. The wetting behaviour of the film surface was studied by a simple water immersion test. The results show that copper dodecanoate film retained superhydrophobic property even after immersing in water for about 140 h. The optical absorption spectrum exhibits two broadbands centred at 388 and 630 nm that have been assigned to B-2(1g) -> E-2(g) and B-2(1g) -> B-2(2g) transitions of Cu2+ ions, respectively. The electron paramagnetic resonance spectrum exhibits two resonance signals with effective g values at g(parallel to)approximate to 2.308 and g(perpendicular to) approximate to 2.071, which suggests that the unpaired electron occupies d(x2-y2) orbital in the ground state. Copyright (C) 2011 John Wiley & Sons, Ltd.
Item Type: | Journal Article |
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Publication: | Surface and Interface Analysis |
Publisher: | John Wiley and Sons |
Additional Information: | Copyright for this article belongs to John Wiley and Sons |
Keywords: | superhydrophobic;copper dodecanoate;water contact angle;XRD; FESEM;FTIR;EPR;optical absorption |
Department/Centre: | Division of Chemical Sciences > Solid State & Structural Chemistry Unit |
Date Deposited: | 13 Aug 2012 10:11 |
Last Modified: | 27 Aug 2012 05:04 |
URI: | http://eprints.iisc.ac.in/id/eprint/44482 |
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