Antimicrobial Properties of Nanostructured TiO2 Plus Fe Additive Thin Films Synthesized by a Cost-Effective Sol-Gel Process

Endrino, JL and Prasad, RGSV and Basavaraju, D and Rao, KN and Mosquera, A and Naveen, CS and Phani, AR (2011) Antimicrobial Properties of Nanostructured TiO2 Plus Fe Additive Thin Films Synthesized by a Cost-Effective Sol-Gel Process. In: Nanoscience and Nanotechnology Letters, 3 (5). pp. 629-636.

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Abstract

We prepared thin films composed of pure TiO2 or TiO2 with an Fe additive (at concentrations of 0.2-0.8 wt%) via a simple and cost effective sol gel process, and tested their antifungal properties (against Candida albicans (MTCC-1637), Candida tropicalis (MTCC-184), Candida parapsilosis (MTCC-2509), and Candida glabrata (MTCC-3019) and antibacterial properties (against Staphylococcus faecalis (NCIM-2604) Staphylococcus epidermidis (NCIM-2493), Staphylococcus aureus (NCIL-2122), and Bacillus subtilis (NCIM-2549)). The films were deposited on glass and Si substrates and subjected to annealing at 400 degrees C for 3 h in ambient air. The film structural and morphological properties were investigated by X-ray photoelectron spectroscopy profilometry and scanning electron microscopy, respectively. Antifungal and antibacterial tests were conducted using the drop test method. Among the species examined, Candida albicans (MTCC-1637), and Staphylococcus aureus (NCIL-2122) showed complete colony formation inhibition after exposure for 4 h for the TiO2 loaded with 0.8 wt% Fe thin films. These results indicate that increasing the Fe concentration increased the antimicrobial activity, with complete inhibition of colony formation after 4 h exposure.

Item Type:	Journal Article
Publication:	Nanoscience and Nanotechnology Letters
Publisher:	American Scientific Publishers
Additional Information:	Copyright of this article belongs to American Scientific Publishers.
Keywords:	Sol-Gel Process;TiO2 Thin Films;Scanning Electron Microscopy; Antimicrobial Activity;X-Ray Photoelectron Spectroscopy;Fe Additive
Department/Centre:	Division of Physical & Mathematical Sciences > Instrumentation Appiled Physics
Date Deposited:	09 Mar 2012 11:36
Last Modified:	09 Mar 2012 11:43
URI:	http://eprints.iisc.ac.in/id/eprint/43873

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