Prasad, S and Paul, A (2012) Growth and consumption rates of the phase layers during interdiffusion in a diffusion couple with finite end member. In: Journal of Materials Science: Materials in Electronics, 23 (1). pp. 75-85.
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Abstract
The relations for the growth and consumption rates of a layer with finite thickness as an end member and the product phases in the interdiffusion zone are developed. We have used two different methodologies, the diffusion based and the physico-chemical approach to develop the same relations. We have shown that the diffusion based approach is rather straightforward; however, the physico-chemical approach is much more versatile than the other method. It was found that the position of the marker plane becomes vague in the second stage of the interdiffusion process in pure A thin layer/B couple, where two phases grow simultaneously.
Item Type: | Journal Article |
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Publication: | Journal of Materials Science: Materials in Electronics |
Publisher: | Springer |
Additional Information: | Copyright of this article belongs to Springer. |
Department/Centre: | Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy) |
Date Deposited: | 03 Feb 2012 12:19 |
Last Modified: | 03 Feb 2012 12:19 |
URI: | http://eprints.iisc.ac.in/id/eprint/43389 |
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