Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes

Prasad, KVR and Raju, AR and Varma, KBR and Satyalakshmi, KM and Mallya, RM and Hegde, MS (1993) Growth and ferroelectric properties of Bi2VO5.5 thin films with metallic LaNiO3 electrodes. In: Applied Physics Letters, 63 (14). 1898 -1900.

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Abstract

Novel ferroelectric bismuth vanadate, Bi2VO5.5 (BVO), thin films have been grown between lattice matched metallic LaNiO3 (LNO) layers deposited on SrTiO3 (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c‐oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance ∼20 Ω in addition to aiding c‐axis oriented BVO growth. The dielectric constant, ϵr of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant (ϵr=123). The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, Pr=4.6×10−8 C/cm2 and coercive field, Ec=23 kV/cm at 300 K.

Item Type:	Journal Article
Publication:	Applied Physics Letters
Publisher:	American Institute of Physics
Additional Information:	Copyright of this article belongs to American Institute of Physics.
Department/Centre:	Division of Chemical Sciences > Materials Research Centre Division of Chemical Sciences > Solid State & Structural Chemistry Unit Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited:	03 Jan 2012 09:02
Last Modified:	03 Jan 2012 09:02
URI:	http://eprints.iisc.ac.in/id/eprint/43005

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