Neelam, K and Krupanidhi, SB and Varma, KBR (2007) Optical properties of Bi2VO5.5 thin films on platinized silicon measured by spectroscopic ellipsometry. In: IUMRS-ICAM 2007 , 8-13, October 2007 .
Full text not available from this repository. (Request a copy)| Item Type: | Conference Paper |
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| Department/Centre: | Division of Chemical Sciences > Materials Research Centre |
| Date Deposited: | 11 Oct 2011 06:08 |
| Last Modified: | 11 Oct 2011 06:08 |
| URI: | http://eprints.iisc.ac.in/id/eprint/41334 |
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